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Exam SY0-701 All Questions
Exam SY0-701 All Questions

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CompTIA Security+ SY0-701 Question # 23 Topic 3 Discussion

SY0-701 Exam Topic 3 Question 23 Discussion:
Question #: 23
Topic #: 3

Which of the following aspects of the data management life cycle is most directly impacted by local and international regulations?


A.

Destruction


B.

Certification


C.

Retention


D.

Sanitization


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